Microscopy, Electron, Scanning


Electron Microscopies, Scanning

Electron Microscopy, Scanning

Electron Scanning Microscopies

Electron Scanning Microscopy

Microscopies, Electron Scanning

Microscopies, Scanning Electron

Microscopy, Electron Scanning

Microscopy, Scanning Electron

Scanning Electron Microscopies

Scanning Electron Microscopy

Scanning Microscopies, Electron

Scanning Microscopy, Electron

Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY.