Microscopy, Atomic Force


Atomic Force Microscopies

Atomic Force Microscopy

Force Microscopies

Force Microscopies, Scanning

Force Microscopy

Force Microscopy, Scanning

Microscopies, Atomic Force

Microscopies, Force

Microscopies, Scanning Force

Microscopy, Force

Microscopy, Scanning Force

Scanning Force Microscopies

Scanning Force Microscopy

A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.